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Applied Optics|January 16, 2010
Computer analysis of resonance profiles by the method of least squaresD L EdererApplied Optics|February 6, 2010
Absolute Radiometric Calibration of Detectors Between 200-600AE B Saloman, D L EdererApplied Optics|January 9, 2010
Instrumental aspects of synchrotron XUV spectroscopyR P Madden, D L Ederer, K CodlingThe Review of Scientific Instruments|December 1, 1979
In situ preparation of thin sodium films as an expendable filter in the vacuum ultravioletD L Ederer, T A Callcott, E T ArakawaJournal of Research of the National Bureau of Standards. Section A, Physics and Chemistry|March 19, 2020
The Use of Synchrotron Radiation as an Absolute Source of VUV RadiationD L Ederer, E B Saloman, S C Ebner, et al.Journal of Synchrotron Radiation|August 30, 2002
Interaction of atomic systems with X-ray free-electron lasersM A Kornberg, A L Godunov, S Itza-Ortiz, et al.Physical Review Letters|October 10, 2006
X-ray microprobe of orbital alignment in strong-field ionized atomsL Young, D A Arms, E M Dufresne, et al.Pageof 1