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The Review of Scientific Instruments|June 3, 2016
Operando x-ray photoelectron emission microscopy for studying forward and reverse biased silicon p-n junctionsN Barrett, D M Gottlob, C Mathieu, et al.Ultramicroscopy|April 17, 2013
Time-resolved magnetic imaging in an aberration-corrected, energy-filtered photoemission electron microscopeF Nickel, D M Gottlob, I P Krug, et al.Nature Materials|March 21, 2017
Functional electronic inversion layers at ferroelectric domain wallsJ A Mundy, J Schaab, Y Kumagai, et al.Pageof 1