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Optics Express
|
June 11, 2008
Phase-contrast tomography of single-material objects from few projections
G R Myers, D M Paganin, T E Gureyev, et al.
Micron (Oxford, England : 1993)
|
December 18, 2009
Phase retrieval low energy electron microscopy
R P Yu, S M Kennedy, D M Paganin, et al.
Optics Express
|
November 10, 2016
Effect of specimen orientation on the accuracy of vector field electron tomography
Z D C Kemp, D M Paganin, T C Petersen, et al.
Ultramicroscopy
|
July 9, 2011
Projected thickness reconstruction from a single defocused transmission electron microscope image of an amorphous object
A C Y Liu, D M Paganin, L Bourgeois, et al.
Optics Letters
|
August 3, 2012
Iterative retrieval of one-dimensional x ray wave field using a single intensity measurement
D Pelliccia, D M Paganin, A Sorrentino, et al.
Physical Review Letters
|
August 25, 2004
Generalized eikonal of partially coherent beams and its use in quantitative imaging
T E Gureyev, D M Paganin, A W Stevenson, et al.
Ultramicroscopy
|
February 22, 2011
Caustic imaging of gallium droplets using mirror electron microscopy
S M Kennedy, C X Zheng, W X Tang, et al.
Micron (Oxford, England : 1993)
|
July 8, 2019
High contrast at low dose using a single, defocussed transmission electron micrograph
L Clark, T C Petersen, T Williams, et al.
Physical Review Letters
|
February 5, 2013
Electron vortex production and control using aberration induced diffraction catastrophes
T C Petersen, M Weyland, D M Paganin, et al.
Physical Review Letters
|
April 2, 2019
Simple Wave-Optical Superpositions as Prime Number Sieves
T C Petersen, M Ceko, I D Svalbe, et al.
Page
of 4
Search research articles
Search
Showing results (11-20 of 34) with videos related to
Sort By:
Page
of 4
Optics Express
|
June 11, 2008
Phase-contrast tomography of single-material objects from few projections
G R Myers, D M Paganin, T E Gureyev, et al.
Micron (Oxford, England : 1993)
|
December 18, 2009
Phase retrieval low energy electron microscopy
R P Yu, S M Kennedy, D M Paganin, et al.
Optics Express
|
November 10, 2016
Effect of specimen orientation on the accuracy of vector field electron tomography
Z D C Kemp, D M Paganin, T C Petersen, et al.
Ultramicroscopy
|
July 9, 2011
Projected thickness reconstruction from a single defocused transmission electron microscope image of an amorphous object
A C Y Liu, D M Paganin, L Bourgeois, et al.
Optics Letters
|
August 3, 2012
Iterative retrieval of one-dimensional x ray wave field using a single intensity measurement
D Pelliccia, D M Paganin, A Sorrentino, et al.
Physical Review Letters
|
August 25, 2004
Generalized eikonal of partially coherent beams and its use in quantitative imaging
T E Gureyev, D M Paganin, A W Stevenson, et al.
Ultramicroscopy
|
February 22, 2011
Caustic imaging of gallium droplets using mirror electron microscopy
S M Kennedy, C X Zheng, W X Tang, et al.
Micron (Oxford, England : 1993)
|
July 8, 2019
High contrast at low dose using a single, defocussed transmission electron micrograph
L Clark, T C Petersen, T Williams, et al.
Physical Review Letters
|
February 5, 2013
Electron vortex production and control using aberration induced diffraction catastrophes
T C Petersen, M Weyland, D M Paganin, et al.
Physical Review Letters
|
April 2, 2019
Simple Wave-Optical Superpositions as Prime Number Sieves
T C Petersen, M Ceko, I D Svalbe, et al.
Page
of 4