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The Review of Scientific Instruments
|
March 3, 2016
An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics
M P Valdivia, D Stutman, C Stoeckl, et al.
Applied Optics
|
August 23, 2007
High-efficiency fast scintillators for "optical" soft x-ray arrays for laboratory plasma diagnostics
L F Delgado-Aparicio, D Stutman, K Tritz, et al.
Physical Review Letters
|
October 10, 2006
Observation of instability-induced current redistribution in a spherical-torus plasma
J E Menard, R E Bell, D A Gates, et al.
Optics Express
|
June 14, 2025
Referenceless, grating-based, single shot X-ray phase contrast imaging with optimized laser-driven K-α sources
V Bouffetier, G Pérez-Callejo, D Stutman, et al.
The Review of Scientific Instruments
|
March 2, 2020
Implementation of a Talbot-Lau x-ray deflectometer diagnostic platform for the OMEGA EP laser
M P Valdivia, D Stutman, C Stoeckl, et al.
The Review of Scientific Instruments
|
December 3, 2016
Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)
M P Valdivia, D Stutman, C Stoeckl, et al.
The Review of Scientific Instruments
|
December 3, 2016
Publisher's Note: "Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)" [Rev. Sci. Instrum. 87, 11D501 (2016)]
M P Valdivia, D Stutman, C Stoeckl, et al.
The Review of Scientific Instruments
|
December 3, 2016
Multi-energy SXR cameras for magnetically confined fusion plasmas (invited)
L F Delgado-Aparicio, J Maddox, N Pablant, et al.
The Review of Scientific Instruments
|
December 3, 2022
Current advances on Talbot-Lau x-ray imaging diagnostics for high energy density experiments (invited)
M P Valdivia, G Perez-Callejo, V Bouffetier, et al.
The Review of Scientific Instruments
|
November 8, 2018
X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry
M P Valdivia, F Veloso, D Stutman, et al.
Page
of 4
Search research articles
Search
Showing results (21-30 of 34) with videos related to
Sort By:
Page
of 4
The Review of Scientific Instruments
|
March 3, 2016
An x-ray backlit Talbot-Lau deflectometer for high-energy-density electron density diagnostics
M P Valdivia, D Stutman, C Stoeckl, et al.
Applied Optics
|
August 23, 2007
High-efficiency fast scintillators for "optical" soft x-ray arrays for laboratory plasma diagnostics
L F Delgado-Aparicio, D Stutman, K Tritz, et al.
Physical Review Letters
|
October 10, 2006
Observation of instability-induced current redistribution in a spherical-torus plasma
J E Menard, R E Bell, D A Gates, et al.
Optics Express
|
June 14, 2025
Referenceless, grating-based, single shot X-ray phase contrast imaging with optimized laser-driven K-α sources
V Bouffetier, G Pérez-Callejo, D Stutman, et al.
The Review of Scientific Instruments
|
March 2, 2020
Implementation of a Talbot-Lau x-ray deflectometer diagnostic platform for the OMEGA EP laser
M P Valdivia, D Stutman, C Stoeckl, et al.
The Review of Scientific Instruments
|
December 3, 2016
Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)
M P Valdivia, D Stutman, C Stoeckl, et al.
The Review of Scientific Instruments
|
December 3, 2016
Publisher's Note: "Talbot-Lau x-ray deflectometer electron density diagnostic for laser and pulsed power high energy density plasma experiments (invited)" [Rev. Sci. Instrum. 87, 11D501 (2016)]
M P Valdivia, D Stutman, C Stoeckl, et al.
The Review of Scientific Instruments
|
December 3, 2016
Multi-energy SXR cameras for magnetically confined fusion plasmas (invited)
L F Delgado-Aparicio, J Maddox, N Pablant, et al.
The Review of Scientific Instruments
|
December 3, 2022
Current advances on Talbot-Lau x-ray imaging diagnostics for high energy density experiments (invited)
M P Valdivia, G Perez-Callejo, V Bouffetier, et al.
The Review of Scientific Instruments
|
November 8, 2018
X-ray backlighter requirements for refraction-based electron density diagnostics through Talbot-Lau deflectometry
M P Valdivia, F Veloso, D Stutman, et al.
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of 4