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IEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|January 1, 1989
Pattern recognition in the ultrasonic imaging of reverberant multilayered structuresJ Saniie, D T NagleIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|January 1, 1992
Analysis of order-statistic CFAR threshold estimators for improved ultrasonic flaw detectionJ Saniie, D T NagleIEEE Transactions on Ultrasonics, Ferroelectrics, and Frequency Control|January 1, 1991
Analysis of order statistic filters applied to ultrasonic flaw detection using split-spectrum processingJ Saniie, D T Nagle, K D DonohuePageof 1