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Applied Optics|January 14, 2010
Unfolding spectrometer slit broadening effects from broad spectraD W BerremanApplied Optics|August 12, 2010
Multilayer reflecting x-ray optical systems: chromatic vignetting by narrow reflection bandsD W BerremanApplied Optics|January 12, 2010
Kramers-Kronig analysis of reflectance measured at oblique incidenceD W BerremanApplied Optics|February 20, 2010
Doubly curved crystal point-focusing x-ray monochromators: geometrical and practical opticsD W Berreman, J Stamatoff, S J KennedyOptics Letters|September 22, 2009
Soft-x-ray projection lithography: printing of 0.2-microm features using a 20:1 reductionD W Berreman, J E Bjorkholm, L Eichner, et al.Pageof 1