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Sensors (Basel, Switzerland)|February 28, 2023

Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced DataJeong Eun Choi, Da Hoon Seol, Chan Young Kim, et al.

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Sensors (Basel, Switzerland)|February 28, 2023

Generative Adversarial Network-Based Fault Detection in Semiconductor Equipment with Class-Imbalanced DataJeong Eun Choi, Da Hoon Seol, Chan Young Kim, et al.

Pageof 1