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Scientific Reports|August 22, 2023
Deep learning for automated materials characterisation in core-loss electron energy loss spectroscopyArno Annys, Daen Jannis, Johan Verbeeck
Ultramicroscopy|June 20, 2026
Characterization of the Timepix4 hybrid pixel detector and its impact on four-dimensional scanning transmission electron microscopy (4D-STEM)Vojtěch Skoumal, Daen Jannis, Erik Kieft, et al.
Ultramicroscopy|August 26, 2023
Convexity constraints on linear background models for electron energy-loss spectraWouter Van den Broek, Daen Jannis, Jo Verbeeck
Ultramicroscopy|June 19, 2023
Characterization of a Timepix detector for use in SEM acceleration voltage rangeNikita Denisov, Daen Jannis, Andrey Orekhov, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|April 25, 2022
Real-Time Integration Center of Mass (riCOM) Reconstruction for 4D STEMChu-Ping Yu, Thomas Friedrich, Daen Jannis, et al.
Ultramicroscopy|December 11, 2024
Improved precision and accuracy of electron energy-loss spectroscopy quantification via fine structure fitting with constrained optimizationDaen Jannis, Wouter Van den Broek, Zezhong Zhang, et al.
Ultramicroscopy|December 7, 2024
Relativistic EELS scattering cross-sections for microanalysis based on Dirac solutionsZezhong Zhang, Ivan Lobato, Hamish Brown, et al.
Journal of Physics. Condensed Matter : an Institute of Physics Journal|May 24, 2019
Physical properties of epitaxial SrMnO<sub>2.5-δ</sub> F <sub>γ</sub> oxyfluoride filmsJiayi Wang, Yongjin Shin, Nicolas Gauquelin, et al.
Advanced Materials (Deerfield Beach, Fla.)|September 26, 2025
Tunable and Persistent Macroscopic Polarization in Nominally Centrosymmetric Defective OxidesDae-Sung Park, Nini Pryds, Nicolas Gauquelin, et al.
Nano Letters|January 20, 2021
Spatially Controlled Octahedral Rotations and Metal-Insulator Transitions in Nickelate SuperlatticesBinbin Chen, Nicolas Gauquelin, Robert J Green, et al.
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