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Optics Express|June 2, 2009
Direct spectral phase function calculation for dispersive interferometric thickness profilometryDaesuk Kim, Soohyun KimOptics Express|January 7, 2010
A simple and quantitative alignment procedure between solid state camerasHyungchul Lee, Daesuk Kim, Soohyun KimOptics Express|June 9, 2009
White light on-axis digital holographic microscopy based on spectral phase shiftingDaesuk Kim, Jang Woo You, Soohyun KimOptics Express|December 10, 2008
High speed volumetric thickness profile measurement based on full-field wavelength scanning interferometerJang-Woo You, Soohyun Kim, Daesuk KimOptics Express|December 24, 2008
Efficient double-filtering with a single acousto-optic tunable filterJang-Woo You, Jeongho Ahn, Soohyun Kim, et al.Optics Express|February 4, 2009
Simultaneous measurement method of total and self-interference for the volumetric thickness-profilometerJang-Woo You, Daesuk Kim, Sung Yoon Ryu, et al.Optics Express|June 2, 2009
Distortion-tolerant 3-D object recognition by using single exposure on-axis digital holographyDaesuk Kim, Bahram JavidiOptics Express|September 22, 2011
Coherent noise suppression in digital holography based on flat fielding with apodized aperturesD G Abdelsalam, Daesuk KimOptics Express|February 7, 2018
Interferometric snapshot spectro-ellipsometryVamara Dembele, Moonseob Jin, Inho Choi, et al.Optics Express|July 14, 2016
Dynamic spectro-polarimeter based on a modified Michelson interferometric schemeVamara Dembele, Moonseob Jin, Byung-Joon Baek, et al.Pageof 3