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Analytical Chemistry|May 3, 2002
Interpretation of static time-of-flight secondary ion mass spectra of adsorbed protein films by multivariate pattern recognitionM S Wagner, B J Tyler, David G CastnerAnalytical Chemistry|February 14, 2004
Quantitative X-ray photoelectron spectroscopy and time-of-flight secondary ion mass spectrometry characterization of the components in DNACollin J May, Heather E Canavan, David G CastnerLangmuir : the ACS Journal of Surfaces and Colloids|March 16, 2016
ToF-SIMS and XPS Characterization of Protein Films Adsorbed onto Bare and Sodium Styrenesulfonate-Grafted Gold SubstratesRami N Foster, Elisa T Harrison, David G CastnerMicroscopy Today|August 31, 2016
Use of XPS to Quantify Thickness of Coatings on NanoparticlesDonald R Baer, Yung-Cheng Wang, David G CastnerBiophysical Journal|September 25, 2007
Structure and reactivity of adsorbed fibronectin films on micaJames R Hull, Glen S Tamura, David G CastnerSurface and Interface Analysis : SIA|April 26, 2011
Comparison of Bi(1), Bi(3) and C(60) primary ion sources for ToF-SIMS imaging of patterned protein samplesManish Dubey, J Brison, David W Grainger, et al.Biomaterials|February 26, 2004
Guided cell patterning on gold-silicon dioxide substrates by surface molecular engineeringMandana Veiseh, Bronwyn T Wickes, David G Castner, et al.Analytical Chemistry|January 14, 2011
Method for determining the elemental composition and distribution in semiconductor core-shell quantum dotsGilad Zorn, Shivang R Dave, Xiaohu Gao, et al.Langmuir : the ACS Journal of Surfaces and Colloids|April 2, 2005
Probing the orientation of surface-immobilized immunoglobulin G by time-of-flight secondary ion mass spectrometryHua Wang, David G Castner, Buddy D Ratner, et al.Langmuir : the ACS Journal of Surfaces and Colloids|August 26, 2010
Structure and order of phosphonic acid-based self-assembled monolayers on Si(100)Manish Dubey, Tobias Weidner, Lara J Gamble, et al.Pageof 22