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IEEE Transactions on Pattern Analysis and Machine Intelligence|May 30, 2012
SLIC superpixels compared to state-of-the-art superpixel methodsRadhakrishna Achanta, Appu Shaji, Kevin Smith, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|November 16, 2011
BRIEF: Computing a Local Binary Descriptor Very FastMichael Calonder, Vincent Lepetit, Mustafa Özuysal, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|June 3, 2017
Robust 3D Object Tracking from Monocular Images Using Stable PartsAlberto Crivellaro, Mahdi Rad, Yannick Verdie, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|March 10, 2020
Eigendecomposition-Free Training of Deep Networks for Linear Least-Square ProblemsZheng Dang, Kwang Moo Yi, Yinlin Hu, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|April 21, 2021
Promoting Connectivity of Network-Like Structures by Enforcing Region SeparationDoruk Oner, Mateusz Kozinski, Leonardo Citraro, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|August 6, 2020
GarNet++: Improving Fast and Accurate Static 3D Cloth Draping by Curvature LossErhan Gundogdu, Victor Constantin, Shaifali Parashar, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|September 10, 2015
Non-Rigid Graph Registration Using Active Testing SearchEduard Serradell, Miguel Amável Pinheiro, Raphael Sznitman, et al.
IEEE Transactions on Image Processing : a Publication of the IEEE Signal Processing Society|April 11, 2019
A Performance Evaluation of Local Features for Image-Based 3D ReconstructionBin Fan, Qingqun Kong, Xinchao Wang, et al.
IEEE Transactions on Pattern Analysis and Machine Intelligence|March 24, 2012
Gradient response maps for real-time detection of textureless objectsStefan Hinterstoisser, Cedric Cagniart, Slobodan Ilic, et al.
Information Processing in Medical Imaging : Proceedings of the ... Conference|April 2, 2014
Active testing search for point cloud matchingMiguel Amável Pinheiro, Raphael Sznitman, Eduard Serradell, et al.
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