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Nature Materials
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March 6, 2003
Electron microscopy: Better vision with electron lenses
David Cockayne
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences
|
August 19, 2009
New possibilities with aberration-corrected electron microscopy
David Cockayne, Angus I Kirkland, Peter D Nellist, et al.
Journal of Electron Microscopy
|
June 24, 2005
Experimental evaluation of a spherical aberration-corrected TEM and STEM
Hidetaka Sawada, Takeshi Tomita, Mikio Naruse, et al.
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of 1
Search research articles
Search
Showing results (1-10 of 3) with videos related to
Sort By:
Page
of 1
Nature Materials
|
March 6, 2003
Electron microscopy: Better vision with electron lenses
David Cockayne
Philosophical Transactions. Series A, Mathematical, Physical, and Engineering Sciences
|
August 19, 2009
New possibilities with aberration-corrected electron microscopy
David Cockayne, Angus I Kirkland, Peter D Nellist, et al.
Journal of Electron Microscopy
|
June 24, 2005
Experimental evaluation of a spherical aberration-corrected TEM and STEM
Hidetaka Sawada, Takeshi Tomita, Mikio Naruse, et al.
Page
of 1