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David J Smith

Ultramicroscopy

Showing results (1-10 of 7) with videos related to

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Ultramicroscopy|December 7, 2007
Progress and perspectives for atomic-resolution electron microscopyDavid J Smith
Ultramicroscopy|September 1, 2020
A hyperspectral unmixing framework for energy-loss near-edge structure analysisSirong Lu, David J Smith
Ultramicroscopy|December 31, 2002
Semiconductor dopant profiling by off-axis electron holographyJing Li, M R McCartney, David J Smith
Ultramicroscopy|December 21, 2016
The scientific careers of Robert Sinclair and Nestor Zaluzec - A brief sketchHamish L Fraser, David J Smith, James E Wittig
Ultramicroscopy|March 7, 2006
Reconstruction technique for off-axis electron holography using coarse fringesTakeshi Fujita, Kazuo Yamamoto, Martha R McCartney, et al.
Ultramicroscopy|February 18, 2019
Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunitiesMartha R McCartney, Rafal E Dunin-Borkowski, David J Smith
Ultramicroscopy|September 4, 2018
An EELS signal-from-background separation algorithm for spectral line-scan/image quantificationSirong Lu, Kristy J Kormondy, Alexander A Demkov, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|December 7, 2007
Progress and perspectives for atomic-resolution electron microscopyDavid J Smith
Ultramicroscopy|September 1, 2020
A hyperspectral unmixing framework for energy-loss near-edge structure analysisSirong Lu, David J Smith
Ultramicroscopy|December 31, 2002
Semiconductor dopant profiling by off-axis electron holographyJing Li, M R McCartney, David J Smith
Ultramicroscopy|December 21, 2016
The scientific careers of Robert Sinclair and Nestor Zaluzec - A brief sketchHamish L Fraser, David J Smith, James E Wittig
Ultramicroscopy|March 7, 2006
Reconstruction technique for off-axis electron holography using coarse fringesTakeshi Fujita, Kazuo Yamamoto, Martha R McCartney, et al.
Ultramicroscopy|February 18, 2019
Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunitiesMartha R McCartney, Rafal E Dunin-Borkowski, David J Smith
Ultramicroscopy|September 4, 2018
An EELS signal-from-background separation algorithm for spectral line-scan/image quantificationSirong Lu, Kristy J Kormondy, Alexander A Demkov, et al.
Pageof 1