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David N Seidman

Showing results (11-20 of 48) with videos related to

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Physical Review Letters|September 28, 2010
Simultaneous segregation at coherent and semicoherent heterophase interfacesAniruddha Biswas, Donald J Siegel, David N Seidman
Ultramicroscopy|October 21, 2017
Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analysesSung-Il Baik, Dieter Isheim, David N Seidman
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2007
Atom probe tomographic studies of precipitation in Al-0.1Zr-0.1Ti (at.%) alloysKeith E Knipling, David C Dunand, David N Seidman
Nanotechnology|April 14, 2016
Evidence of sub-10 nm aluminum-oxygen precipitates in siliconOussama Moutanabbir, Dieter Isheim, Zugang Mao, et al.
Acta Materialia|October 17, 2022
Solute-induced strengthening during creep of an aged-hardened Al-Mn-Zr alloyAmir R Farkoosh, David C Dunand, David N Seidman
Acta Materialia|October 17, 2022
Enhanced age-hardening response and creep resistance of an Al-0.5Mn-0.3Si (at.%) alloy by Sn inoculationAmir R Farkoosh, David C Dunand, David N Seidman
Ultramicroscopy|June 23, 2015
C12/C13-ratio determination in nanodiamonds by atom-probe tomographyJosiah B Lewis, Dieter Isheim, Christine Floss, et al.
Ultramicroscopy|January 22, 2003
Efficient sampling for three-dimensional atom probe microscopy dataOlof C Hellman, John Blatz du Rivage, David N Seidman
ACS Nano|December 25, 2012
Direct atomic-scale imaging of hydrogen and oxygen interstitials in pure niobium using atom-probe tomography and aberration-corrected scanning transmission electron microscopyYoon-Jun Kim, Runzhe Tao, Robert F Klie, et al.
Ultramicroscopy|July 1, 2014
Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale featuresMatthew I Hartshorne, Dieter Isheim, David N Seidman, et al.
Pageof 5

Showing results (11-20 of 48) with videos related to

Sort By:
Pageof 5
Physical Review Letters|September 28, 2010
Simultaneous segregation at coherent and semicoherent heterophase interfacesAniruddha Biswas, Donald J Siegel, David N Seidman
Ultramicroscopy|October 21, 2017
Systematic approaches for targeting an atom-probe tomography sample fabricated in a thin TEM specimen: Correlative structural, chemical and 3-D reconstruction analysesSung-Il Baik, Dieter Isheim, David N Seidman
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|November 16, 2007
Atom probe tomographic studies of precipitation in Al-0.1Zr-0.1Ti (at.%) alloysKeith E Knipling, David C Dunand, David N Seidman
Nanotechnology|April 14, 2016
Evidence of sub-10 nm aluminum-oxygen precipitates in siliconOussama Moutanabbir, Dieter Isheim, Zugang Mao, et al.
Acta Materialia|October 17, 2022
Solute-induced strengthening during creep of an aged-hardened Al-Mn-Zr alloyAmir R Farkoosh, David C Dunand, David N Seidman
Acta Materialia|October 17, 2022
Enhanced age-hardening response and creep resistance of an Al-0.5Mn-0.3Si (at.%) alloy by Sn inoculationAmir R Farkoosh, David C Dunand, David N Seidman
Ultramicroscopy|June 23, 2015
C12/C13-ratio determination in nanodiamonds by atom-probe tomographyJosiah B Lewis, Dieter Isheim, Christine Floss, et al.
Ultramicroscopy|January 22, 2003
Efficient sampling for three-dimensional atom probe microscopy dataOlof C Hellman, John Blatz du Rivage, David N Seidman
ACS Nano|December 25, 2012
Direct atomic-scale imaging of hydrogen and oxygen interstitials in pure niobium using atom-probe tomography and aberration-corrected scanning transmission electron microscopyYoon-Jun Kim, Runzhe Tao, Robert F Klie, et al.
Ultramicroscopy|July 1, 2014
Specimen preparation for correlating transmission electron microscopy and atom probe tomography of mesoscale featuresMatthew I Hartshorne, Dieter Isheim, David N Seidman, et al.
Pageof 5