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David S Simons

Showing results (1-10 of 6) with videos related to

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Journal of Analytical Atomic Spectrometry|June 20, 2017
Measurement of uranium-236 in particles by secondary ion mass spectrometryDavid S Simons, John D Fassett
Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics : Materials, Processing, Measurement, & Phenomena : JVST B|June 23, 2016
Uranium Ion Yields from Monodisperse Uranium Oxide ParticlesNicholas Sharp, John D Fassett, David S Simons
Journal of Analytical Atomic Spectrometry|December 29, 2022
Improved Uranium Particle Analysis by SIMS using O<sub>3</sub> <sup>-</sup> Primary IonsEvan E Groopman, Todd L Williamson, David S Simons
The Analyst|June 15, 2019
Advances in age-dating of individual uranium particles by large geometry secondary ion mass spectrometryChristopher Szakal, David S Simons, John D Fassett, et al.
Analytical Chemistry|November 25, 2003
Radiochemical neutron activation analysis for certification of ion-implanted phosphorus in siliconRick L Paul, David S Simons, William F Guthrie, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 25, 2009
Characterization of SiGe films for use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)Ryna B Marinenko, Shirley Turner, David S Simons, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Journal of Analytical Atomic Spectrometry|June 20, 2017
Measurement of uranium-236 in particles by secondary ion mass spectrometryDavid S Simons, John D Fassett
Journal of Vacuum Science and Technology. B, Nanotechnology & Microelectronics : Materials, Processing, Measurement, & Phenomena : JVST B|June 23, 2016
Uranium Ion Yields from Monodisperse Uranium Oxide ParticlesNicholas Sharp, John D Fassett, David S Simons
Journal of Analytical Atomic Spectrometry|December 29, 2022
Improved Uranium Particle Analysis by SIMS using O<sub>3</sub> <sup>-</sup> Primary IonsEvan E Groopman, Todd L Williamson, David S Simons
The Analyst|June 15, 2019
Advances in age-dating of individual uranium particles by large geometry secondary ion mass spectrometryChristopher Szakal, David S Simons, John D Fassett, et al.
Analytical Chemistry|November 25, 2003
Radiochemical neutron activation analysis for certification of ion-implanted phosphorus in siliconRick L Paul, David S Simons, William F Guthrie, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 25, 2009
Characterization of SiGe films for use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)Ryna B Marinenko, Shirley Turner, David S Simons, et al.
Pageof 1