De-ren Yang - JoVE Visualize

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Journal of Zhejiang University. Science|October 21, 2003

A method for predicting critical load evaluating adhesion of coatings in scratch testingXi-fang Chen, Mi Yan, De-ren Yang, et al.

Journal of Zhejiang University. Science. B|October 28, 2005

Influence of polarized bias and porous silicon morphology on the electrical behavior of Au-porous silicon contactsYue Zhao, Dong-sheng Li, Shou-xiang Xing, et al.

ACS Omega|October 28, 2024

Engineering Optimization of Producing High-Purity Dichlorosilane in a Fixed-Bed Reactor by Trichlorosilane DecompositionJian-Hua Liu, Bang-Jie Zhang, Zhen-Jun Yuan, et al.

Nanoscale|May 6, 2015

Electrically pumped random lasing with an onset voltage of sub-3 V from ZnO-based light-emitting devices featuring nanometer-thick MoO3 interlayersCan-Xing Wang, Chun-Yan Lv, Chen Zhu, et al.

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Showing results (1-10 of 4) with videos related to

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Journal of Zhejiang University. Science|October 21, 2003

A method for predicting critical load evaluating adhesion of coatings in scratch testingXi-fang Chen, Mi Yan, De-ren Yang, et al.

Journal of Zhejiang University. Science. B|October 28, 2005

Influence of polarized bias and porous silicon morphology on the electrical behavior of Au-porous silicon contactsYue Zhao, Dong-sheng Li, Shou-xiang Xing, et al.

ACS Omega|October 28, 2024

Engineering Optimization of Producing High-Purity Dichlorosilane in a Fixed-Bed Reactor by Trichlorosilane DecompositionJian-Hua Liu, Bang-Jie Zhang, Zhen-Jun Yuan, et al.

Nanoscale|May 6, 2015

Electrically pumped random lasing with an onset voltage of sub-3 V from ZnO-based light-emitting devices featuring nanometer-thick MoO3 interlayersCan-Xing Wang, Chun-Yan Lv, Chen Zhu, et al.

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