Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Derek Bean

Showing results (1-10 of 4) with videos related to

Pageof 1
Sort By:
Computational Statistics & Data Analysis|January 22, 2009
The Missing Censoring Indicator Model and the Smoothed BootstrapSundarraman Subramanian, Derek Bean
Proceedings of the National Academy of Sciences of the United States of America|August 20, 2013
Optimal M-estimation in high-dimensional regressionDerek Bean, Peter J Bickel, Noureddine El Karoui, et al.
Proceedings of the National Academy of Sciences of the United States of America|August 20, 2013
On robust regression with high-dimensional predictorsNoureddine El Karoui, Derek Bean, Peter J Bickel, et al.
Ultramicroscopy|June 11, 2013
Ranking TEM cameras by their response to electron shot noisePatricia Grob, Derek Bean, Dieter Typke, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Computational Statistics & Data Analysis|January 22, 2009
The Missing Censoring Indicator Model and the Smoothed BootstrapSundarraman Subramanian, Derek Bean
Proceedings of the National Academy of Sciences of the United States of America|August 20, 2013
Optimal M-estimation in high-dimensional regressionDerek Bean, Peter J Bickel, Noureddine El Karoui, et al.
Proceedings of the National Academy of Sciences of the United States of America|August 20, 2013
On robust regression with high-dimensional predictorsNoureddine El Karoui, Derek Bean, Peter J Bickel, et al.
Ultramicroscopy|June 11, 2013
Ranking TEM cameras by their response to electron shot noisePatricia Grob, Derek Bean, Dieter Typke, et al.
Pageof 1