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Ultramicroscopy|March 30, 2019
Tip wear and tip breakage in high-speed atomic force microscopesTimo Strahlendorff, Gaoliang Dai, Detlef Bergmann, et al.Applied Optics|February 23, 2023
In situ, back-focal-plane-based determination of the numerical apertures in optical microscopesJan Krüger, Detlef Bergmann, Rainer Köning, et al.Scientific Reports|January 31, 2018
Using DNA origami nanorulers as traceable distance measurement standards and nanoscopic benchmark structuresMario Raab, Ija Jusuk, Julia Molle, et al.Sensors (Basel, Switzerland)|October 23, 2019
Nanomechanical Characterization of Vertical Nanopillars Using an MEMS-SPM Nano-Bending Testing PlatformZhi Li, Sai Gao, Uwe Brand, et al.Ultramicroscopy|May 16, 2021
A new type of nanoscale reference grating manufactured by combined laser-focused atomic deposition and x-ray interference lithography and its use for calibrating a scanning electron microscopeXiao Deng, Gaoliang Dai, Jie Liu, et al.Nanomaterials (Basel, Switzerland)|March 29, 2023
Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference NanoparticlesNicolas Feltin, Loïc Crouzier, Alexandra Delvallée, et al.Pageof 1