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Dianna Y Liu

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Optics Express|June 18, 2009
Needle-based reflection refractometry of scattering samples using coherence-gated detectionAdam M Zysk, Daniel L Marks, Dianna Y Liu, et al.
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Showing results (1-10 of 1) with videos related to

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Pageof 1
Optics Express|June 18, 2009
Needle-based reflection refractometry of scattering samples using coherence-gated detectionAdam M Zysk, Daniel L Marks, Dianna Y Liu, et al.
Pageof 1