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The Review of Scientific Instruments|August 3, 2011
Note: Optical fiber milled by focused ion beam and its application for Fabry-Pérot refractive index sensorWu Yuan, Fei Wang, Alexey Savenko, et al.
The Review of Scientific Instruments|January 30, 2021
Four-probe sensing of temperature during Joule heating of siliconAsger Kjærgård Pedersen, Daena Madhi, Daniil Mirosnikov, et al.
Small (Weinheim an Der Bergstrasse, Germany)|September 27, 2008
Epitaxial integration of nanowires in microsystems by local micrometer-scale vapor-phase epitaxyKristian Mølhave, Brent A Wacaser, Dirch Hjorth Petersen, et al.
Nanotechnology|October 24, 2013
Ultra-high aspect ratio replaceable AFM tips using deformation-suppressed focused ion beam millingAlexey Savenko, Izzet Yildiz, Dirch Hjorth Petersen, et al.
Nanotechnology|September 11, 2010
Customizable in situ TEM devices fabricated in freestanding membranes by focused ion beam millingAnders Lei, Dirch Hjorth Petersen, Timothy John Booth, et al.
Micromachines|June 2, 2021
Selective Direct Laser Writing of Pyrolytic Carbon Microelectrodes in Absorber-Modified SU-8Emil Ludvigsen, Nina Ritter Pedersen, Xiaolong Zhu, et al.
Optics Express|May 3, 2018
Quality assessment of terahertz time-domain spectroscopy transmission and reflection modes for graphene conductivity mappingDavid M A Mackenzie, Patrick R Whelan, Peter Bøggild, et al.
Science Advances|February 26, 2025
Thermal diffusivity microscope: Zooming in on anisotropic heat transportNeetu Lamba, Braulio Beltrán-Pitarch, Tianbo Yu, et al.
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