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Science (New York, N.Y.)
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April 3, 2010
Applied physics. Why thick can be slick
Martin H Müser, Dmitry Shakhvorostov
Advanced Materials (Deerfield Beach, Fla.)
|
June 3, 2010
A gold marker technique revealing phase-specific wear and sub-surface deformation with nanometer resolution
Dmitry Shakhvorostov, Peter R Norton, Martin H Müser
The Journal of Chemical Physics
|
August 7, 2009
Smart materials behavior in phosphates: role of hydroxyl groups and relevance to antiwear films
Dmitry Shakhvorostov, Martin H Müser, Yang Song, et al.
The Journal of Chemical Physics
|
February 27, 2008
On the pressure-induced loss of crystallinity in orthophosphates of zinc and calcium
Dmitry Shakhvorostov, Martin H Müser, Nicholas J Mosey, et al.
Proceedings of the National Academy of Sciences of the United States of America
|
June 25, 2009
Evidence for electronic gap-driven metal-semiconductor transition in phase-change materials
Dmitry Shakhvorostov, Razvan A Nistor, Lia Krusin-Elbaum, et al.
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Search research articles
Search
Showing results (1-10 of 5) with videos related to
Sort By:
Page
of 1
Science (New York, N.Y.)
|
April 3, 2010
Applied physics. Why thick can be slick
Martin H Müser, Dmitry Shakhvorostov
Advanced Materials (Deerfield Beach, Fla.)
|
June 3, 2010
A gold marker technique revealing phase-specific wear and sub-surface deformation with nanometer resolution
Dmitry Shakhvorostov, Peter R Norton, Martin H Müser
The Journal of Chemical Physics
|
August 7, 2009
Smart materials behavior in phosphates: role of hydroxyl groups and relevance to antiwear films
Dmitry Shakhvorostov, Martin H Müser, Yang Song, et al.
The Journal of Chemical Physics
|
February 27, 2008
On the pressure-induced loss of crystallinity in orthophosphates of zinc and calcium
Dmitry Shakhvorostov, Martin H Müser, Nicholas J Mosey, et al.
Proceedings of the National Academy of Sciences of the United States of America
|
June 25, 2009
Evidence for electronic gap-driven metal-semiconductor transition in phase-change materials
Dmitry Shakhvorostov, Razvan A Nistor, Lia Krusin-Elbaum, et al.
Page
of 1