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Donald Windover

Showing results (1-10 of 6) with videos related to

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Acta Crystallographica. Section A, Foundations and Advances|July 1, 2021
Polarization effects of X-ray monochromators modeled using dynamical scattering theoryMarcus H Mendenhall, David Black, Donald Windover, et al.
Metrologia|June 23, 2016
Characterization of a self-calibrating, high-precision, stacked-stage, vertical dual-axis goniometerMarcus H Mendenhall, Albert Henins, Donald Windover, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|August 24, 2016
Advancing X-ray scattering metrology using inverse genetic algorithmsAdam F Hannon, Daniel F Sunday, Donald Windover, et al.
Journal of Research of the National Institute of Standards and Technology|March 10, 2016
The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference MaterialsJames P Cline, Marcus H Mendenhall, David Black, et al.
The Review of Scientific Instruments|October 14, 2024
An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)Dylan J Kirsch, Joshua Martin, Ronald Warzoha, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal|August 1, 2017
High-precision measurement of the X-ray Cu K<i>α</i> spectrumMarcus H Mendenhall, Albert Henins, Lawrence T Hudson, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Acta Crystallographica. Section A, Foundations and Advances|July 1, 2021
Polarization effects of X-ray monochromators modeled using dynamical scattering theoryMarcus H Mendenhall, David Black, Donald Windover, et al.
Metrologia|June 23, 2016
Characterization of a self-calibrating, high-precision, stacked-stage, vertical dual-axis goniometerMarcus H Mendenhall, Albert Henins, Donald Windover, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3|August 24, 2016
Advancing X-ray scattering metrology using inverse genetic algorithmsAdam F Hannon, Daniel F Sunday, Donald Windover, et al.
Journal of Research of the National Institute of Standards and Technology|March 10, 2016
The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference MaterialsJames P Cline, Marcus H Mendenhall, David Black, et al.
The Review of Scientific Instruments|October 14, 2024
An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)Dylan J Kirsch, Joshua Martin, Ronald Warzoha, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal|August 1, 2017
High-precision measurement of the X-ray Cu K<i>α</i> spectrumMarcus H Mendenhall, Albert Henins, Lawrence T Hudson, et al.
Pageof 1