Search research articles
Contact Us
Filters
Showing results (1-10 of 6) with videos related to
Page
of 1
Sort By:
Acta Crystallographica. Section A, Foundations and Advances
|
July 1, 2021
Polarization effects of X-ray monochromators modeled using dynamical scattering theory
Marcus H Mendenhall, David Black, Donald Windover, et al.
Metrologia
|
June 23, 2016
Characterization of a self-calibrating, high-precision, stacked-stage, vertical dual-axis goniometer
Marcus H Mendenhall, Albert Henins, Donald Windover, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3
|
August 24, 2016
Advancing X-ray scattering metrology using inverse genetic algorithms
Adam F Hannon, Daniel F Sunday, Donald Windover, et al.
Journal of Research of the National Institute of Standards and Technology
|
March 10, 2016
The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference Materials
James P Cline, Marcus H Mendenhall, David Black, et al.
The Review of Scientific Instruments
|
October 14, 2024
An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)
Dylan J Kirsch, Joshua Martin, Ronald Warzoha, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal
|
August 1, 2017
High-precision measurement of the X-ray Cu K<i>α</i> spectrum
Marcus H Mendenhall, Albert Henins, Lawrence T Hudson, et al.
Page
of 1
Search research articles
Search
Showing results (1-10 of 6) with videos related to
Sort By:
Page
of 1
Acta Crystallographica. Section A, Foundations and Advances
|
July 1, 2021
Polarization effects of X-ray monochromators modeled using dynamical scattering theory
Marcus H Mendenhall, David Black, Donald Windover, et al.
Metrologia
|
June 23, 2016
Characterization of a self-calibrating, high-precision, stacked-stage, vertical dual-axis goniometer
Marcus H Mendenhall, Albert Henins, Donald Windover, et al.
Journal of Micro/Nanolithography, MEMS, and MOEMS : JM3
|
August 24, 2016
Advancing X-ray scattering metrology using inverse genetic algorithms
Adam F Hannon, Daniel F Sunday, Donald Windover, et al.
Journal of Research of the National Institute of Standards and Technology
|
March 10, 2016
The Optics and Alignment of the Divergent Beam Laboratory X-ray Powder Diffractometer and its Calibration Using NIST Standard Reference Materials
James P Cline, Marcus H Mendenhall, David Black, et al.
The Review of Scientific Instruments
|
October 14, 2024
An instrumentation guide to measuring thermal conductivity using frequency domain thermoreflectance (FDTR)
Dylan J Kirsch, Joshua Martin, Ronald Warzoha, et al.
Journal of Physics. B, Atomic, Molecular, and Optical Physics : an Institute of Physics Journal
|
August 1, 2017
High-precision measurement of the X-ray Cu K<i>α</i> spectrum
Marcus H Mendenhall, Albert Henins, Lawrence T Hudson, et al.
Page
of 1