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Dor Verbin

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IEEE Transactions on Pattern Analysis and Machine Intelligence|May 18, 2021
Unique Geometry and Texture From Corresponding Image PatchesDor Verbin, Steven J Gortler, Todd Zickler
IEEE Transactions on Pattern Analysis and Machine Intelligence|January 30, 2024
Ref-NeRF: Structured View-Dependent Appearance for Neural Radiance FieldsDor Verbin, Peter Hedman, Ben Mildenhall, et al.
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Showing results (1-10 of 2) with videos related to

Sort By:
Pageof 1
IEEE Transactions on Pattern Analysis and Machine Intelligence|May 18, 2021
Unique Geometry and Texture From Corresponding Image PatchesDor Verbin, Steven J Gortler, Todd Zickler
IEEE Transactions on Pattern Analysis and Machine Intelligence|January 30, 2024
Ref-NeRF: Structured View-Dependent Appearance for Neural Radiance FieldsDor Verbin, Peter Hedman, Ben Mildenhall, et al.
Pageof 1