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AACE Clinical Case Reports|January 23, 2020
GLUCOSE CHANGES IN A PATIENT WITH INSULIN AUTOIMMUNE SYNDROME DEMONSTRATED BY CONTINUOUS GLUCOSE MONITORINGShi-Dou Lin, Shang-Ren HsuJournal of the Chinese Medical Association : JCMA|November 23, 2006
Association between serum uric acid level and components of the metabolic syndromeShi-Dou Lin, Dong-Hwa Tsai, Shang-Ren HsuDiabetes Research and Clinical Practice|September 22, 2017
Diabetes mellitus increased all-cause mortality rate among newly-diagnosed tuberculosis patients in an Asian population: A nationwide population-based studyPo-Yen Ko, Shi-Dou Lin, Ming-Chia Hsieh, et al.Postgraduate Medicine|August 22, 2015
A workable model for the management of hyperglycemia in non-critically ill patients in an Asian populationShi-Dou Lin, Shih-Te Tu, Mei-Jung Lin, et al.Journal of the Chinese Medical Association : JCMA|October 21, 2006
Characteristics predicting dyslipidemia in drug-naïve type 2 diabetes patientsShi-Dou Lin, Shih-Te Tu, Shang-Ren Hsu, et al.Frontiers in Pediatrics|May 8, 2025
Sleep quality, anxiety, and depression among perioperative caregivers of children with tethered cord syndrome: a cross-sectional survey analysisJinrun Lin, Hao Li, Suqin Xia, et al.Small (Weinheim an Der Bergstrasse, Germany)|June 19, 2026
Boosting Ion Transport in MXene Films via In-Plane Nanopores and Embedded TiO2 Nanoparticles: Toward Ultrafast SupercapacitorsSuxia Jiang, Pei Li, Ziyan Zhou, et al.Small (Weinheim an Der Bergstrasse, Germany)|November 9, 2024
Compact Carbon-Based Ultra-High-Power Electrodes: A Sodium Alginate-Induced Self-Shrinkage and Densification ApproachDou Lin, Pei Li, Ziyan Zhou, et al.Medicine|August 28, 2015
The Association Between Body Mass Index and All-Cause Mortality in Patients With Type 2 Diabetes Mellitus: A 5.5-Year Prospective AnalysisJeng-Fu Kuo, Yi-Ting Hsieh, I-Chieh Mao, et al.Advanced Materials (Deerfield Beach, Fla.)|May 8, 2026
Crystallinity-Engineered Three-Dimensional Graphitic Carbon Tube Grids as Load-Tolerant Electrodes for AC Line-Filtering CapacitorsPei Li, Fangming Han, Dou Lin, et al.Pageof 3