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Douglas C Meier

Showing results (1-10 of 6) with videos related to

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Journal of the American Chemical Society|February 12, 2004
The influence of metal cluster size on adsorption energies: CO adsorbed on Au clusters supported on TiO2Douglas C Meier, D Wayne Goodman
Annual Review of Analytical Chemistry (Palo Alto, Calif.)|July 20, 2010
Detecting chemical hazards with temperature-programmed microsensors: overcoming complex analytical problems with multidimensional databasesDouglas C Meier, Baranidharan Raman, Steve Semancik
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 7, 2011
An examination of kernite (Na2B4O6(OH)2·3H2O) using X-ray and electron spectroscopies: quantitative microanalysis of a hydrated low-Z mineralDouglas C Meier, Jeffrey M Davis, Edward P Vicenzi
ACS Nano|February 12, 2009
Analysis of copper incorporation into zinc oxide nanowiresSusie Eustis, Douglas C Meier, Michael R Beversluis, et al.
Sensors and Actuators. B, Chemical|December 10, 2016
The I/O transform of a chemical sensorNalin Katta, Douglas C Meier, Kurt D Benkstein, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 25, 2009
Characterization of SiGe films for use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)Ryna B Marinenko, Shirley Turner, David S Simons, et al.
Pageof 1

Showing results (1-10 of 6) with videos related to

Sort By:
Pageof 1
Journal of the American Chemical Society|February 12, 2004
The influence of metal cluster size on adsorption energies: CO adsorbed on Au clusters supported on TiO2Douglas C Meier, D Wayne Goodman
Annual Review of Analytical Chemistry (Palo Alto, Calif.)|July 20, 2010
Detecting chemical hazards with temperature-programmed microsensors: overcoming complex analytical problems with multidimensional databasesDouglas C Meier, Baranidharan Raman, Steve Semancik
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 7, 2011
An examination of kernite (Na2B4O6(OH)2·3H2O) using X-ray and electron spectroscopies: quantitative microanalysis of a hydrated low-Z mineralDouglas C Meier, Jeffrey M Davis, Edward P Vicenzi
ACS Nano|February 12, 2009
Analysis of copper incorporation into zinc oxide nanowiresSusie Eustis, Douglas C Meier, Michael R Beversluis, et al.
Sensors and Actuators. B, Chemical|December 10, 2016
The I/O transform of a chemical sensorNalin Katta, Douglas C Meier, Kurt D Benkstein, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 25, 2009
Characterization of SiGe films for use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)Ryna B Marinenko, Shirley Turner, David S Simons, et al.
Pageof 1