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Dunin-Borkowski

Showing results (31-40 of 316) with videos related to

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Materials (Basel, Switzerland)|December 24, 2021
Structural Phase Transition and In-Situ Energy Storage Pathway in Nonpolar Materials: A ReviewXian-Kui Wei, Rafal E Dunin-Borkowski, Joachim Mayer
Physical Review Letters|June 13, 2002
Quantitative electron holography of biased semiconductor devicesA C Twitchett, R E Dunin-Borkowski, P A Midgley
Ultramicroscopy|August 10, 2015
Surface effects on mean inner potentials studied using density functional theoryRobert S Pennington, Chris B Boothroyd, Rafal E Dunin-Borkowski
Small Science|April 11, 2025
In Situ Scanning Transmission Electron Microscopy Calcination of Palladium Nitrate Supported on Zinc OxideAnsgar Meise, Marc Heggen, Rafal E Dunin-Borkowski, et al.
Ultramicroscopy|February 18, 2019
Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunitiesMartha R McCartney, Rafal E Dunin-Borkowski, David J Smith
Ultramicroscopy|February 23, 2019
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Christian Colliex, Archie Howie and Hannes Lichte on the occasion of their 75th, 85th and 75th birthdaysRafal E Dunin-Borkowski, Joachim Mayer, Carsten Sachse, et al.
Ultramicroscopy|June 18, 2021
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80th, 75th and 80th birthdaysRafal E Dunin-Borkowski, Joachim Mayer, Carsten Sachse, et al.
The EMBO Journal|July 16, 1997
Specificity of PS integrin function during embryogenesis resides in the alpha subunit extracellular domainM D Martin-Bermudo, O M Dunin-Borkowski, N H Brown
Journal of Applied Crystallography|August 6, 2025
On the use of beam precession for serial electron crystallographySergi Plana-Ruiz, Penghan Lu, Govind Ummethala, et al.
Scanning|July 22, 2008
Mapping the electrical properties of semiconductor junctions--the electron holographic approachAlison C Twitchett-Harrison, Rafal E Dunin-Borkowski, Paul A Midgley
Pageof 32

Showing results (31-40 of 316) with videos related to

Sort By:
Pageof 32
Materials (Basel, Switzerland)|December 24, 2021
Structural Phase Transition and In-Situ Energy Storage Pathway in Nonpolar Materials: A ReviewXian-Kui Wei, Rafal E Dunin-Borkowski, Joachim Mayer
Physical Review Letters|June 13, 2002
Quantitative electron holography of biased semiconductor devicesA C Twitchett, R E Dunin-Borkowski, P A Midgley
Ultramicroscopy|August 10, 2015
Surface effects on mean inner potentials studied using density functional theoryRobert S Pennington, Chris B Boothroyd, Rafal E Dunin-Borkowski
Small Science|April 11, 2025
In Situ Scanning Transmission Electron Microscopy Calcination of Palladium Nitrate Supported on Zinc OxideAnsgar Meise, Marc Heggen, Rafal E Dunin-Borkowski, et al.
Ultramicroscopy|February 18, 2019
Quantitative measurement of nanoscale electrostatic potentials and charges using off-axis electron holography: Developments and opportunitiesMartha R McCartney, Rafal E Dunin-Borkowski, David J Smith
Ultramicroscopy|February 23, 2019
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Christian Colliex, Archie Howie and Hannes Lichte on the occasion of their 75th, 85th and 75th birthdaysRafal E Dunin-Borkowski, Joachim Mayer, Carsten Sachse, et al.
Ultramicroscopy|June 18, 2021
Introduction to a special issue on Frontiers of Aberration Corrected Electron Microscopy in honour of Wolfgang Baumeister, Colin Humphreys, John Spence and Knut Urban on the occasion of their 75th, 80th, 75th and 80th birthdaysRafal E Dunin-Borkowski, Joachim Mayer, Carsten Sachse, et al.
The EMBO Journal|July 16, 1997
Specificity of PS integrin function during embryogenesis resides in the alpha subunit extracellular domainM D Martin-Bermudo, O M Dunin-Borkowski, N H Brown
Journal of Applied Crystallography|August 6, 2025
On the use of beam precession for serial electron crystallographySergi Plana-Ruiz, Penghan Lu, Govind Ummethala, et al.
Scanning|July 22, 2008
Mapping the electrical properties of semiconductor junctions--the electron holographic approachAlison C Twitchett-Harrison, Rafal E Dunin-Borkowski, Paul A Midgley
Pageof 32