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E A Kenik

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Journal of Electron Microscopy Technique|June 1, 1991
Loss of grain boundary segregant during ion millingE A Kenik
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2004
Atom probe tomography: a technique for nanoscale characterizationM K Miller, E A Kenik
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 17, 2008
Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limitC Kisielowski, B Freitag, M Bischoff, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Journal of Electron Microscopy Technique|June 1, 1991
Loss of grain boundary segregant during ion millingE A Kenik
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 6, 2004
Atom probe tomography: a technique for nanoscale characterizationM K Miller, E A Kenik
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 17, 2008
Detection of single atoms and buried defects in three dimensions by aberration-corrected electron microscope with 0.5-A information limitC Kisielowski, B Freitag, M Bischoff, et al.
Pageof 1