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Journal of Microscopy|November 25, 2003
Directional analysis of digitized planar sets by configuration countsE B V Jensen, M KiderlenJournal of Microscopy|March 26, 2013
On semiautomatic estimation of surface areaJ Dvořák, E B V JensenJournal of Microscopy|November 2, 2004
Directional analysis of digitized three-dimensional images by configuration countsP Gutkowski, E B V Jensen, M KiderlenJournal of Microscopy|July 24, 2002
On the orientational analysis of planar fibre systems from digital imagesS Kärkkäinen, E B V Jensen, D JeulinJournal of Microscopy|January 19, 2005
Shape discrimination by total curvature, with a view to cancer diagnosticsR J Gardner, A Hobolth, E B V Jensen, et al.Journal of Microscopy|December 17, 2010
The semi-automatic nucleatorL V Hansen, J R Nyengaard, J B Andersen, et al.Pageof 1