Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

E J Kirkland

Showing results (1-10 of 8) with videos related to

Pageof 1
Sort By:
Ultramicroscopy|June 7, 2012
A high efficiency annular dark field detector for STEME J Kirkland, M G Thomas
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Depth-dependent imaging of individual dopant atoms in siliconP M Voyles, D A Muller, E J Kirkland
Ultramicroscopy|January 1, 1980
Digital reconstruction of bright field phase contrast images from high resolution electron micrographsE J Kirkland, B M Siegel, N Uyeda, et al.
Ultramicroscopy|April 3, 2001
Simulation of thermal diffuse scattering including a detailed phonon dispersion curveD A Muller, B Edwards, E J Kirkland, et al.
Ultramicroscopy|December 28, 2007
Effects of tilt on high-resolution ADF-STEM imagingS E Maccagnano-Zacher, K A Mkhoyan, E J Kirkland, et al.
Ultramicroscopy|April 1, 2008
Effects of amorphous layers on ADF-STEM imagingK A Mkhoyan, S E Maccagnano-Zacher, E J Kirkland, et al.
Ultramicroscopy|November 1, 2006
Separation of bulk and surface-losses in low-loss EELS measurements in STEMK A Mkhoyan, T Babinec, S E Maccagnano, et al.
Physical Review Letters|February 9, 2005
Spatial distribution of competing ions around DNA in solutionK Andresen, R Das, H Y Park, et al.
Pageof 1

Showing results (1-10 of 8) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|June 7, 2012
A high efficiency annular dark field detector for STEME J Kirkland, M G Thomas
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|August 13, 2004
Depth-dependent imaging of individual dopant atoms in siliconP M Voyles, D A Muller, E J Kirkland
Ultramicroscopy|January 1, 1980
Digital reconstruction of bright field phase contrast images from high resolution electron micrographsE J Kirkland, B M Siegel, N Uyeda, et al.
Ultramicroscopy|April 3, 2001
Simulation of thermal diffuse scattering including a detailed phonon dispersion curveD A Muller, B Edwards, E J Kirkland, et al.
Ultramicroscopy|December 28, 2007
Effects of tilt on high-resolution ADF-STEM imagingS E Maccagnano-Zacher, K A Mkhoyan, E J Kirkland, et al.
Ultramicroscopy|April 1, 2008
Effects of amorphous layers on ADF-STEM imagingK A Mkhoyan, S E Maccagnano-Zacher, E J Kirkland, et al.
Ultramicroscopy|November 1, 2006
Separation of bulk and surface-losses in low-loss EELS measurements in STEMK A Mkhoyan, T Babinec, S E Maccagnano, et al.
Physical Review Letters|February 9, 2005
Spatial distribution of competing ions around DNA in solutionK Andresen, R Das, H Y Park, et al.
Pageof 1