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Journal of Radiological Protection : Official Journal of the Society for Radiological Protection|June 17, 2024
Analysis of radon mitigation methods: 10-year reviewE Kouroukla, T D Gooding, H S FonsecaJournal of Radiological Protection : Official Journal of the Society for Radiological Protection|September 24, 2024
Distribution of radon in large workplaces: an analysis performed on radon levels measured in UK schoolsE Kouroukla, T D GoodingJournal of Radiological Protection : Official Journal of the Society for Radiological Protection|April 18, 2015
Luminescence-based retrospective dosimetry using Al2O3 from mobile phones: a simulation approach to determine the effects of positionJ S Eakins, E KourouklaJournal of Environmental Radioactivity|January 5, 2002
Variations in the concentration of radon in parts of the Ogof Ffynnon Ddu system, Penwyllt, South Wales and estimates of doses to recreational caversC R L Friend, T D GoodingThe Joint Commission Journal on Quality Improvement|July 21, 1999
Patient-centered measurement at an academic medical centerT D Gooding, L Newcomb, K MertensRadiation Protection Dosimetry|January 14, 2016
THE PHE FORTUITOUS DOSIMETRY CAPABILITY BASED ON OPTICALLY STIMULATED LUMINESCENCE OF MOBILE PHONESJ S Eakins, L G Hager, E Kouroukla, et al.Journal of Radiological Protection : Official Journal of the Society for Radiological Protection|March 30, 2021
Virtual estimation of effective dose in neutron fieldsJ Eakins, M Abdelrahman, L Hager, et al.Revista Brasileira De Fisioterapia (Sao Carlos (Sao Paulo, Brazil))|August 24, 2010
Inter- and intra-examiner reliability of footprint pattern analysis obtained from diabetics using the Harris matLígia de Loiola Cisneros, Tiago H S Fonseca, Vivianni C AbreuVeterinary Journal (London, England : 1997)|November 6, 2019
Chemiluminescent ELISA with multi-epitope proteins to improve the diagnosis of canine visceral leishmaniasisT H S Fonseca, A R Faria, H M Leite, et al.ACS Applied Materials & Interfaces|December 20, 2023
Scanning Tunneling Spectroscopy Method for the Prediction of Semiconductor Heterojunction Performance as a Prequel for Device DevelopmentThiago C Ribeiro, Daniel H S Fonseca, Rafael Reis Barreto, et al.Pageof 2