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Micron (Oxford, England : 1993)|August 12, 2006
TEM-nanoindentation studies of semiconducting structuresE Le Bourhis, G Patriarche
Nanotechnology|February 16, 2016
Locally measuring the adhesion of InP directly bonded on sub-100 nm patterned SiK Pantzas, E Le Bourhis, G Patriarche, et al.
ACS Applied Materials & Interfaces|January 11, 2020
Extrinsic Measurement of Carbon Black Aggregate Distribution within a Fluoroelastomer Matrix from Nanoindentation ExperimentsP Baral, C Fradet, F Lacroix, et al.
The Review of Scientific Instruments|November 2, 2010
Development of a synchrotron biaxial tensile device for in situ characterization of thin films mechanical responseG Geandier, D Thiaudière, R N Randriamazaoro, et al.
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