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E Okunishi

Showing results (1-10 of 7) with videos related to

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Ultramicroscopy|August 18, 2012
Defect structures in ZnO studied by high-resolution structural and spectroscopic imagingH Schmid, E Okunishi, W Mader
Micron (Oxford, England : 1993)|July 5, 2011
Structural and elemental analysis of iron and indium doped zinc oxide by spectroscopic imaging in Cs-corrected STEMH Schmid, E Okunishi, T Oikawa, et al.
Ultramicroscopy|March 1, 2011
Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundaryS D Findlay, S Azuma, N Shibata, et al.
Ultramicroscopy|May 4, 2010
Dynamics of annular bright field imaging in scanning transmission electron microscopyS D Findlay, N Shibata, H Sawada, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|October 28, 2004
Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopyK Watanabe, Y Kikuchi, T Yamazaki, et al.
Ultramicroscopy|August 24, 2013
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM imagesH E, K E Macarthur, T J Pennycook, et al.
Physical Review Letters|October 11, 2014
Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitrideJ G Lozano, H Yang, M P Guerrero-Lebrero, et al.
Pageof 1

Showing results (1-10 of 7) with videos related to

Sort By:
Pageof 1
Ultramicroscopy|August 18, 2012
Defect structures in ZnO studied by high-resolution structural and spectroscopic imagingH Schmid, E Okunishi, W Mader
Micron (Oxford, England : 1993)|July 5, 2011
Structural and elemental analysis of iron and indium doped zinc oxide by spectroscopic imaging in Cs-corrected STEMH Schmid, E Okunishi, T Oikawa, et al.
Ultramicroscopy|March 1, 2011
Direct oxygen imaging within a ceramic interface, with some observations upon the dark contrast at the grain boundaryS D Findlay, S Azuma, N Shibata, et al.
Ultramicroscopy|May 4, 2010
Dynamics of annular bright field imaging in scanning transmission electron microscopyS D Findlay, N Shibata, H Sawada, et al.
Acta Crystallographica. Section A, Foundations of Crystallography|October 28, 2004
Lattice imaging in low-angle and high-angle bright-field scanning transmission electron microscopyK Watanabe, Y Kikuchi, T Yamazaki, et al.
Ultramicroscopy|August 24, 2013
Probe integrated scattering cross sections in the analysis of atomic resolution HAADF STEM imagesH E, K E Macarthur, T J Pennycook, et al.
Physical Review Letters|October 11, 2014
Direct observation of depth-dependent atomic displacements associated with dislocations in gallium nitrideJ G Lozano, H Yang, M P Guerrero-Lebrero, et al.
Pageof 1