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E R Kieft

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Structural Dynamics (Melville, N.Y.)|October 6, 2016

Time-of-flight electron energy loss spectroscopy using TM110 deflection cavitiesW Verhoeven, J F M van Rens, M A W van Ninhuijs, et al.

Ultramicroscopy|November 5, 2017

Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM110 mode for ultrafast electron microscopyJ F M van Rens, W Verhoeven, J G H Franssen, et al.

The Review of Scientific Instruments|September 2, 2019

Design and characterization of dielectric filled TM110 microwave cavities for ultrafast electron microscopyW Verhoeven, J F M van Rens, A H Kemper, et al.

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Search research articles

Showing results (11-20 of 13) with videos related to

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You have reached the last page of results.This site can display upto 13 results.

Structural Dynamics (Melville, N.Y.)|October 6, 2016

Time-of-flight electron energy loss spectroscopy using TM110 deflection cavitiesW Verhoeven, J F M van Rens, M A W van Ninhuijs, et al.

Ultramicroscopy|November 5, 2017

Theory and particle tracking simulations of a resonant radiofrequency deflection cavity in TM110 mode for ultrafast electron microscopyJ F M van Rens, W Verhoeven, J G H Franssen, et al.

The Review of Scientific Instruments|September 2, 2019

Design and characterization of dielectric filled TM110 microwave cavities for ultrafast electron microscopyW Verhoeven, J F M van Rens, A H Kemper, et al.

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