Showing results (1-10 of 2) with videos related to
Sort By:
Pageof 1
Ultramicroscopy|April 20, 2001
Crystal thickness and extinction distance determination using energy filtered CBED pattern intensity measurement and dynamical diffraction theory fittingD Delille, R Pantel, E Van CappellenUltramicroscopy|October 17, 2002
Convergent beam electron diffraction extinction distance measurements for quantitative analysis of si(1-x),Ge(x)D Delille, R Pantel, G Vincent, et al.Pageof 1