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Metrologia
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June 19, 2018
Towards Traceable Transient Pressure Metrology
Edward Hanson, Douglas Olson, Haijun Liu, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society
|
March 18, 2024
Quantum-based vacuum metrology at NIST
Julia Scherschligt, James A Fedchak, Zeeshan Ahmed, et al.
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of 1
Search research articles
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Showing results (1-10 of 2) with videos related to
Sort By:
Page
of 1
Metrologia
|
June 19, 2018
Towards Traceable Transient Pressure Metrology
Edward Hanson, Douglas Olson, Haijun Liu, et al.
Journal of Vacuum Science & Technology. A, Vacuum, Surfaces, and Films : an Official Journal of the American Vacuum Society
|
March 18, 2024
Quantum-based vacuum metrology at NIST
Julia Scherschligt, James A Fedchak, Zeeshan Ahmed, et al.
Page
of 1