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Inverse Problems|February 28, 2025
Multi-target detection with application to cryo-electron microscopyTamir Bendory, Nicolas Boumal, William Leeb, et al.
SIAM Journal on Imaging Sciences|August 15, 2024
Toward Single Particle Reconstruction without Particle Picking: Breaking the Detection LimitTamir Bendory, Nicolas Boumal, William Leeb, et al.
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