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Emile van Veldhoven

Showing results (1-10 of 4) with videos related to

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Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|July 5, 2007
Time-resolved optical spectroscopy with multiple population dimensions: a general method for resolving dynamic heterogeneityEmile van Veldhoven, Champak Khurmi, Xinzheng Zhang, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 17, 2011
Angular dependence of the ion-induced secondary electron emission for He+ and Ga+ beamsVincenzo Castaldo, Josephus Withagen, Cornelius Hagen, et al.
Scanning|May 1, 2012
Imaging and nanofabrication with the helium ion microscope of the Van Leeuwenhoek Laboratory in DelftPaul F A Alkemade, Emma M Koster, Emile van Veldhoven, et al.
Nanotechnology|October 16, 2010
Nanopillar growth by focused helium ion-beam-induced depositionPing Chen, Emile van Veldhoven, Colin A Sanford, et al.
Pageof 1

Showing results (1-10 of 4) with videos related to

Sort By:
Pageof 1
Chemphyschem : a European Journal of Chemical Physics and Physical Chemistry|July 5, 2007
Time-resolved optical spectroscopy with multiple population dimensions: a general method for resolving dynamic heterogeneityEmile van Veldhoven, Champak Khurmi, Xinzheng Zhang, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|June 17, 2011
Angular dependence of the ion-induced secondary electron emission for He+ and Ga+ beamsVincenzo Castaldo, Josephus Withagen, Cornelius Hagen, et al.
Scanning|May 1, 2012
Imaging and nanofabrication with the helium ion microscope of the Van Leeuwenhoek Laboratory in DelftPaul F A Alkemade, Emma M Koster, Emile van Veldhoven, et al.
Nanotechnology|October 16, 2010
Nanopillar growth by focused helium ion-beam-induced depositionPing Chen, Emile van Veldhoven, Colin A Sanford, et al.
Pageof 1