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Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|July 15, 2020
Contamination of TEM Holders Quantified and Mitigated With the Open-Hardware, High-Vacuum Bakeout SystemYin Min Goh, Jonathan Schwartz, Emily Rennich, et al.
Proceedings of the National Academy of Sciences of the United States of America|September 5, 2025
Ultracold cryogenic TEM with liquid helium and high stabilityEmily Rennich, Suk Hyun Sung, Nishkarsh Agarwal, et al.
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