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The Review of Scientific Instruments|May 3, 2015
A four-probe thermal transport measurement method for nanostructuresJaehyun Kim, Eric Ou, Daniel P Sellan, et al.
Advanced Materials (Deerfield Beach, Fla.)|November 25, 2016
Temperature and Thickness Dependences of the Anisotropic In-Plane Thermal Conductivity of Black PhosphorusBrandon Smith, Bjorn Vermeersch, Jesús Carrete, et al.
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