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Esther Illek

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Beilstein Journal of Nanotechnology|April 13, 2012
Analysis of force-deconvolution methods in frequency-modulation atomic force microscopyJoachim Welker, Esther Illek, Franz J Giessibl
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Beilstein Journal of Nanotechnology|April 13, 2012
Analysis of force-deconvolution methods in frequency-modulation atomic force microscopyJoachim Welker, Esther Illek, Franz J Giessibl
Pageof 1