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Journal of Analytical Atomic Spectrometry|December 29, 2022
Improved Uranium Particle Analysis by SIMS using O<sub>3</sub> <sup>-</sup> Primary IonsEvan E Groopman, Todd L Williamson, David S Simons
The Analyst|June 13, 2025
Uranium particle age dating, aggregation, and model age best estimatorsEvan E Groopman, Todd L Williamson, Timothy R Pope, et al.
Proceedings of the National Academy of Sciences of the United States of America|August 15, 2018
Discovery of fissionogenic Cs and Ba capture five years after Oklo reactor shutdownEvan E Groopman, David G Willingham, Alex P Meshik, et al.
Journal of Analytical Atomic Spectrometry|July 17, 2020
An overview of NRL's NAUTILUS: a combination SIMS-AMS for spatially resolved trace isotope analysisEvan E Groopman, David G Willingham, Albert J Fahey, et al.
Journal of Analytical Atomic Spectrometry|June 20, 2017
Measurement of uranium-236 in particles by secondary ion mass spectrometryDavid S Simons, John D Fassett
The Journal of Physical Chemistry. B|July 21, 2006
Porous GaN as a template to produce surface-enhanced Raman scattering-active surfacesTodd L Williamson, Xiaoying Guo, Andrew Zukoski, et al.
The Analyst|June 15, 2019
Advances in age-dating of individual uranium particles by large geometry secondary ion mass spectrometryChristopher Szakal, David S Simons, John D Fassett, et al.
Analytical Chemistry|November 25, 2003
Radiochemical neutron activation analysis for certification of ion-implanted phosphorus in siliconRick L Paul, David S Simons, William F Guthrie, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|December 25, 2009
Characterization of SiGe films for use as a National Institute of Standards and Technology Microanalysis Reference Material (RM 8905)Ryna B Marinenko, Shirley Turner, David S Simons, et al.
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