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Nano Letters|March 16, 2012
Graphene at high bias: cracking, layer by layer sublimation, and fusingA Barreiro, F Börrnert, M H Rümmeli, et al.
Journal of Microscopy|November 27, 2012
Retro-fitting an older (S)TEM with two Cs aberration correctors for 80 kV and 60 kV operationF Börrnert, A Bachmatiuk, S Gorantla, et al.
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