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Journal of Microscopy|May 13, 2016
Evaluation of neon focused ion beam milling for TEM sample preparationT C Pekin, F I Allen, A M MinorUltramicroscopy|February 22, 2011
Chemical mapping of a block copolymer electrolyte by low-loss EFTEM spectrum-imaging and principal component analysisF I Allen, M Watanabe, Z Lee, et al.Ultramicroscopy|August 16, 2016
In situ TEM Raman spectroscopy and laser-based materials modificationF I Allen, E Kim, N C Andresen, et al.Pageof 1