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F Pérez-Murano

Showing results (1-10 of 11) with videos related to

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Journal of the Optical Society of America. A, Optics, Image Science, and Vision|August 8, 2001
Comparison of highly efficient absorbing boundary conditions for the beam propagation methodD Jiménez, F Pérez-Murano
Ultramicroscopy|May 6, 2006
A femtogram resolution mass sensor platform, based on SOI electrostatically driven resonant cantilever. Part I: electromechanical model and parameter extractionJ Teva, G Abadal, F Torres, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|January 5, 2001
Characterization of antiresonant reflecting optical waveguide devices by scanning near-field optical microscopyX Borrisé, D Jiménez, F Pérez-Murano, et al.
Ultramicroscopy|May 9, 2006
A femtogram resolution mass sensor platform based on SOI electrostatically driven resonant cantilever. Part II: sensor calibration and glycerine evaporation rate measurementJ Teva, G Abadal, F Torres, et al.
Nanotechnology|March 6, 2014
Enabling electromechanical transduction in silicon nanowire mechanical resonators fabricated by focused ion beam implantationJ Llobet, M Sansa, M Gerbolés, et al.
Ultramicroscopy|June 13, 2003
AFM lithography of aluminum for fabrication of nanomechanical systemsZ J Davis, G Abadal, O Hansen, et al.
Ultramicroscopy|June 13, 2003
Atomic force microscope characterization of a resonating nanocantileverG Abadal, Z J Davis, X Borrisé, et al.
Nanotechnology|August 11, 2011
Full-wafer fabrication by nanostencil lithography of micro/nanomechanical mass sensors monolithically integrated with CMOSJ Arcamone, M A F van den Boogaart, F Serra-Graells, et al.
Ultramicroscopy|July 3, 2004
On the electromechanical modelling of a resonating nano-cantilever-based transducerJ Teva, G Abadal, Z J Davis, et al.
Ultramicroscopy|September 29, 2004
Thermal AFM: a thermopile case studyL Fonseca, F Pérez-Murano, C Calaza, et al.
Pageof 2

Showing results (1-10 of 11) with videos related to

Sort By:
Pageof 2
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|August 8, 2001
Comparison of highly efficient absorbing boundary conditions for the beam propagation methodD Jiménez, F Pérez-Murano
Ultramicroscopy|May 6, 2006
A femtogram resolution mass sensor platform, based on SOI electrostatically driven resonant cantilever. Part I: electromechanical model and parameter extractionJ Teva, G Abadal, F Torres, et al.
Journal of the Optical Society of America. A, Optics, Image Science, and Vision|January 5, 2001
Characterization of antiresonant reflecting optical waveguide devices by scanning near-field optical microscopyX Borrisé, D Jiménez, F Pérez-Murano, et al.
Ultramicroscopy|May 9, 2006
A femtogram resolution mass sensor platform based on SOI electrostatically driven resonant cantilever. Part II: sensor calibration and glycerine evaporation rate measurementJ Teva, G Abadal, F Torres, et al.
Nanotechnology|March 6, 2014
Enabling electromechanical transduction in silicon nanowire mechanical resonators fabricated by focused ion beam implantationJ Llobet, M Sansa, M Gerbolés, et al.
Ultramicroscopy|June 13, 2003
AFM lithography of aluminum for fabrication of nanomechanical systemsZ J Davis, G Abadal, O Hansen, et al.
Ultramicroscopy|June 13, 2003
Atomic force microscope characterization of a resonating nanocantileverG Abadal, Z J Davis, X Borrisé, et al.
Nanotechnology|August 11, 2011
Full-wafer fabrication by nanostencil lithography of micro/nanomechanical mass sensors monolithically integrated with CMOSJ Arcamone, M A F van den Boogaart, F Serra-Graells, et al.
Ultramicroscopy|July 3, 2004
On the electromechanical modelling of a resonating nano-cantilever-based transducerJ Teva, G Abadal, Z J Davis, et al.
Ultramicroscopy|September 29, 2004
Thermal AFM: a thermopile case studyL Fonseca, F Pérez-Murano, C Calaza, et al.
Pageof 2