Jove
Visualize
Contact Us
JoVE
x logofacebook logolinkedin logoyoutube logo
ABOUT JoVE
OverviewLeadershipBlogJoVE Help Center
AUTHORS
Publishing ProcessEditorial BoardScope & PoliciesPeer ReviewFAQSubmit
LIBRARIANS
TestimonialsSubscriptionsAccessResourcesLibrary Advisory BoardFAQ
RESEARCH
JoVE JournalMethods CollectionsJoVE Encyclopedia of ExperimentsArchive
EDUCATION
JoVE CoreJoVE BusinessJoVE Science EducationJoVE Lab ManualFaculty Resource CenterFaculty Site
Terms & Conditions of Use
Privacy Policy
Policies

Filters

Falko Seidel

Showing results (1-10 of 3) with videos related to

Pageof 1
Sort By:
Springerplus|February 27, 2014
Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometryDaniel Lehmann, Falko Seidel, Dietrich Rt Zahn
Nanoscale Research Letters|October 30, 2012
Temperature-dependent Raman investigation of rolled up InGaAs/GaAs microtubesRaul D Rodriguez, Evgeniya Sheremet, Dominic J Thurmer, et al.
ACS Applied Materials & Interfaces|June 13, 2013
Nonaqueous atomic layer deposition of aluminum phosphateStefan Knohl, Amit K Roy, Ralf Lungwitz, et al.
Pageof 1

Showing results (1-10 of 3) with videos related to

Sort By:
Pageof 1
Springerplus|February 27, 2014
Thin films with high surface roughness: thickness and dielectric function analysis using spectroscopic ellipsometryDaniel Lehmann, Falko Seidel, Dietrich Rt Zahn
Nanoscale Research Letters|October 30, 2012
Temperature-dependent Raman investigation of rolled up InGaAs/GaAs microtubesRaul D Rodriguez, Evgeniya Sheremet, Dominic J Thurmer, et al.
ACS Applied Materials & Interfaces|June 13, 2013
Nonaqueous atomic layer deposition of aluminum phosphateStefan Knohl, Amit K Roy, Ralf Lungwitz, et al.
Pageof 1