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Ferdinand Hofer

Showing results (1-10 of 57) with videos related to

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Micron (Oxford, England : 1993)|August 5, 2003
EELS performance measurements on a new high energy resolution imaging filterGerald Kothleitner, Ferdinand Hofer
Ultramicroscopy|July 23, 2003
Elemental occurrence maps: a starting point for quantitative EELS spectrum image processingGerald Kothleitner, Ferdinand Hofer
Micron (Oxford, England : 1993)|April 16, 2003
Width determination of SiO2-films in Si-based devices using low-loss EFTEM: image contrast as a function of sample thicknessBernhard Schaffer, Werner Grogger, Ferdinand Hofer
Ultramicroscopy|March 19, 2005
Advances in the segmentation of multi-component microanalytical imagesJérôme Cutrona, Noël Bonnet, Michel Herbin, et al.
Micron (Oxford, England : 1993)|December 6, 2016
Spectrum image analysis tool - A flexible MATLAB solution to analyze EEL and CL spectrum imagesFranz-Philipp Schmidt, Ferdinand Hofer, Joachim R Krenn
Analytical and Bioanalytical Chemistry|September 18, 2007
Application of high-resolution EFTEM SI in an AEMBernhard Schaffer, Werner Grogger, Gerald Kothleitner, et al.
Micron (Oxford, England : 1993)|March 24, 2006
Electron-irradiation damage in chromium nitrides and chromium oxynitride thin filmsChristoph Mitterbauer, Werner Grogger, Peter Wilhartitz, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2014
Linking TEM analytical spectroscopies for an assumptionless compositional analysisGerald Kothleitner, Werner Grogger, Martina Dienstleder, et al.
Micron (Oxford, England : 1993)|August 16, 2011
Electron microscopy of nanoemulsions: an essential tool for characterisation and stability assessmentVictoria Klang, Nadejda B Matsko, Claudia Valenta, et al.
Ultramicroscopy|July 23, 2003
Energy-filtering TEM at high magnification: spatial resolution and detection limitsWerner Grogger, Bernhard Schaffer, Kannan M Krishnan, et al.
Pageof 6

Showing results (1-10 of 57) with videos related to

Sort By:
Pageof 6
Micron (Oxford, England : 1993)|August 5, 2003
EELS performance measurements on a new high energy resolution imaging filterGerald Kothleitner, Ferdinand Hofer
Ultramicroscopy|July 23, 2003
Elemental occurrence maps: a starting point for quantitative EELS spectrum image processingGerald Kothleitner, Ferdinand Hofer
Micron (Oxford, England : 1993)|April 16, 2003
Width determination of SiO2-films in Si-based devices using low-loss EFTEM: image contrast as a function of sample thicknessBernhard Schaffer, Werner Grogger, Ferdinand Hofer
Ultramicroscopy|March 19, 2005
Advances in the segmentation of multi-component microanalytical imagesJérôme Cutrona, Noël Bonnet, Michel Herbin, et al.
Micron (Oxford, England : 1993)|December 6, 2016
Spectrum image analysis tool - A flexible MATLAB solution to analyze EEL and CL spectrum imagesFranz-Philipp Schmidt, Ferdinand Hofer, Joachim R Krenn
Analytical and Bioanalytical Chemistry|September 18, 2007
Application of high-resolution EFTEM SI in an AEMBernhard Schaffer, Werner Grogger, Gerald Kothleitner, et al.
Micron (Oxford, England : 1993)|March 24, 2006
Electron-irradiation damage in chromium nitrides and chromium oxynitride thin filmsChristoph Mitterbauer, Werner Grogger, Peter Wilhartitz, et al.
Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|March 7, 2014
Linking TEM analytical spectroscopies for an assumptionless compositional analysisGerald Kothleitner, Werner Grogger, Martina Dienstleder, et al.
Micron (Oxford, England : 1993)|August 16, 2011
Electron microscopy of nanoemulsions: an essential tool for characterisation and stability assessmentVictoria Klang, Nadejda B Matsko, Claudia Valenta, et al.
Ultramicroscopy|July 23, 2003
Energy-filtering TEM at high magnification: spatial resolution and detection limitsWerner Grogger, Bernhard Schaffer, Kannan M Krishnan, et al.
Pageof 6