Showing results (1-10 of 26) with videos related to

Sort By:
Pageof 3
The Review of Scientific Instruments|November 7, 2012
Direct structural characterisation of line gratings with grazing incidence small-angle x-ray scatteringJan Wernecke, Frank Scholze, Michael Krumrey
Applied Optics|October 8, 2003
Irradiation stability of silicon photodiodes for extreme-ultraviolet radiationFrank Scholze, Roman Klein, Thomas Bock
Applied Optics|June 13, 2014
Role of dynamic effects in the characterization of multilayers by means of power spectral densityAnton Haase, Victor Soltwisch, Christian Laubis, et al.
Journal of Applied Crystallography|December 17, 2016
Multiparameter characterization of subnanometre Cr/Sc multilayers based on complementary measurementsAnton Haase, Saša Bajt, Philipp Hönicke, et al.
Optics Express|August 10, 2017
Interface morphology of Mo/Si multilayer systems with varying Mo layer thickness studied by EUV diffuse scatteringAnton Haase, Victor Soltwisch, Stefan Braun, et al.
Pageof 3