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Applied Optics|January 6, 2023
Nested Sampling aided determination of tantalum optical constants in the EUV spectral rangeQais Saadeh, Philipp Naujok, Meiyi Wu, et al.Plos One|November 14, 2013
Making research data repositories visible: the re3data.org RegistryHeinz Pampel, Paul Vierkant, Frank Scholze, et al.Applied Optics|July 28, 2016
Modeling and empirical characterization of the polarization response of off-plane reflection gratingsHannah Marlowe, Randall L McEntaffer, James H Tutt, et al.Microscopy and Microanalysis : the Official Journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada|September 21, 2006
The determination of the efficiency of energy dispersive X-ray spectrometers by a new reference materialMarco Alvisi, Markus Blome, Michael Griepentrog, et al.Applied Optics|March 17, 2022
Determination of optical constants of thin films in the EUVRichard Ciesielski, Qais Saadeh, Vicky Philipsen, et al.Journal of Synchrotron Radiation|December 23, 2017
Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage thresholdIgor A Makhotkin, Ryszard Sobierajski, Jaromir Chalupský, et al.Pageof 3