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Applied Optics|April 1, 2020
Conception of diffractive wavefront correction for XUV and soft x-ray spectroscopyJürgen Probst, Christoph Braig, Enrico Langlotz, et al.
The Review of Scientific Instruments|March 6, 2019
Optimization of the size and shape of the scanning aperture in autocollimator-based deflectometric profilometersIan Lacey, Ralf D Geckler, Andreas Just, et al.
Optics Express|August 19, 2018
Effect of the surface roughness on X-ray absorption by mirrors operating at extremely small grazing anglesMingwu Wen, Igor V Kozhevnikov, Frank Siewert, et al.
The Review of Scientific Instruments|December 5, 2025
Invited Article: High-quality blazed gratings through synergy between e-beam lithography and robust characterization techniquesAnalía F Herrero, Nazanin Samadi, Andrey Sokolov, et al.
Journal of Synchrotron Radiation|February 16, 2013
Mo/Si multilayer-coated amplitude-division beam splitters for XUV radiation sourcesRyszard Sobierajski, Rolf Antonie Loch, Robbert W E van de Kruijs, et al.
The Review of Scientific Instruments|December 1, 2025
Advanced electron beam lithography strategies for fabrication of high-precision VLS x-ray gratingsKevin Hofhuis, Nazanin Samadi, Bjarke A Frederiksen, et al.
The Review of Scientific Instruments|July 18, 2023
X-FAST: A versatile, high-throughput, and user-friendly XUV femtosecond absorption spectroscopy tabletop instrumentRyan Ash, Zain Abhari, Roberta Candela, et al.
The Review of Scientific Instruments|June 3, 2016
High precision tilt stage as a key element to a universal test mirror for characterization and calibration of slope measuring instrumentsValeriy V Yashchuk, Nikolay A Artemiev, Gary Centers, et al.
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