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Applied Optics|December 20, 2007
Sizing of irregular particles using a near backscattered laser Doppler systemXuecheng Wu, Gérard Grehan, Kefa Cen, et al.
Optics Express|July 1, 2011
Measurements of 3D relative locations of particles by Fourier Interferometry Imaging (FII)Paul Briard, Sawitree Saengkaew, Xuecheng Wu, et al.
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